Influence of technological defects on the accuracy of measurement of radiation spectrum with Fourier spectrometer

Grzegorz Szymański

Abstract

The aim of the study was to analyze the influence of selected inaccuracy of the interferometer elements and justify the measurement result.
Diploma typeDoctor of Philosophy
Author Grzegorz Szymański (FM / IMPh)
Grzegorz Szymański,,
- The Institute of Micromechanics and Photonics
Title in EnglishInfluence of technological defects on the accuracy of measurement of radiation spectrum with Fourier spectrometer
Languagepl polski
Certifying UnitFaculty of Mechatronics (FM)
Disciplinemechanical engineering / (technology domain) / (technological sciences)
Defense Date18-01-2017
End date25-01-2017
Supervisor Romuald Jóźwicki (FM / IMPh)
Romuald Jóźwicki,,
- The Institute of Micromechanics and Photonics

Leszek Wawrzyniuk (FM / IMPh)
Leszek Wawrzyniuk,,
- The Institute of Micromechanics and Photonics

Internal reviewers Zbigniew Jaroszewicz
Zbigniew Jaroszewicz,,
-
External reviewers Leszek R. Jaroszewicz ()
Leszek R. Jaroszewicz,,
-
Pages127
Keywords in EnglishFourier spectrometer
Abstract in EnglishThe aim of the study was to analyze the influence of selected inaccuracy of the interferometer elements and justify the measurement result.
Thesis file
Autoreferat Grzegorz Szymanski obrona_rozprawy_doktorskiej.pdf 1.09 MB

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