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Influence of technological defects on the accuracy of measurement of radiation spectrum with Fourier spectrometer

Grzegorz Szymański

Abstract

The aim of the study was to analyze the influence of selected inaccuracy of the interferometer elements and justify the measurement result.
Record ID
WUT734c548c8e7e4ea8a8463e632425bbcb
Diploma type
Doctor of Philosophy
Author
Grzegorz Szymański Grzegorz Szymański,, The Institute of Micromechanics and Photonics (FM/IMPh)Faculty of Mechatronics (FM)
Title in Polish
Wpływ wad technologicznych na dokładność pomiaru widma promieniowania spektrometrem fourierowskim
Title in English
Influence of technological defects on the accuracy of measurement of radiation spectrum with Fourier spectrometer
Language
(pl) Polish
Certifying Unit
Faculty of Mechatronics (FM)
Discipline
mechanical engineering / (technology domain) / (technological sciences)
Status
Finished
Defense Date
18-01-2017
Title date
25-01-2017
Supervisor
Internal reviewers
Zbigniew Jaroszewicz Zbigniew Jaroszewicz,, Undefined Affiliation
External reviewers
Leszek R. Jaroszewicz Leszek R. Jaroszewicz,, Faculty of New Technologies and Chemistry, Military University of Technology, Warsaw 00-908, Poland ()
Pages
127
Keywords in English
Fourier spectrometer
Abstract in English
The aim of the study was to analyze the influence of selected inaccuracy of the interferometer elements and justify the measurement result.
Thesis file
  • File: 1
    Autoreferat Grzegorz Szymanski obrona_rozprawy_doktorskiej.pdf
    Request has been registered

Uniform Resource Identifier
https://repo.pw.edu.pl/info/phd/WUT734c548c8e7e4ea8a8463e632425bbcb/
URN
urn:pw-repo:WUT734c548c8e7e4ea8a8463e632425bbcb

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