Application of the neural network in identification of defect centers in SI InP:Fe

Marek Bartosik

Abstract

n/a
Diploma typeMaster of Science
Author Marek Bartosik (FEIT / PE)
Marek Bartosik,,
- The Institute of Electronic Systems
Title in PolishZastosowanie sieci neuronowej do identyfikacji centrów defektowych w SI InP:Fe
Supervisor Stanisław Jankowski (FEIT / PE)
Stanisław Jankowski,,
- The Institute of Electronic Systems

Certifying unitFaculty of Electronics and Information Technology (FEIT)
Affiliation unitThe Institute of Electronic Systems (FEIT / PE)
Languagepl polski
StatusFinished
Issue date (year)2003
Internal identifierENSE-PM.001801
Keywords in Polish-
Keywords in English-

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