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Badania porównawcze mikrogeometrii powierzchni metodą bezstykową (profilometr optyczny CCI SunStar i stykową (profilometr PGI 830)

Paweł Roszkowski

Record ID
WUT0f4199cc2bf3457ea7c91123868aca2e
Diploma type
Master of Science
Author
Paweł Roszkowski (FEIT/PE) Paweł Roszkowski,, The Institute of Electronic Systems (FEIT/PE)Faculty of Electronics and Information Technology (FEIT)
Supervisor
Jan Tomasik (FM/IMBE) Jan Tomasik,, The Institute of Metrology and Biomedical Engineering (FM/IMBE)Faculty of Mechatronics (FM)
Certifying unit
Faculty of Mechatronics (FM)
Affiliation unit
The Institute of Metrology and Biomedical Engineering (FM/IMBE)
Study subject / specialization
, Inżynieria Jakości
Language
(pl) Polish
Status
Finished
Defense Date
20-12-2012
Issue date (year)
2012
Reviewers
Ireneusz Chmielik Ireneusz Chmielik,, Undefined Affiliation

Uniform Resource Identifier
https://repo.pw.edu.pl/info/master/WUT0f4199cc2bf3457ea7c91123868aca2e/
URN
urn:pw-repo:WUT0f4199cc2bf3457ea7c91123868aca2e

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