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Macierze Hankela i Toeplitza i ich zastosowanie w opisie i analizie obrazów i dynamiki obiektów

Marek Piotrowski

Abstract

Record ID
WUT085f4c224e414e909fd2f0372cc4a1bb
Diploma type
Master of Science
Author
Marek Piotrowski (FoEE) Marek Piotrowski,, Faculty of Electrical Engineering (FoEE)
Supervisor
Bartłomiej Beliczyński (FoEE/ICIE) Bartłomiej Beliczyński,, The Institute of Control and Industrial Electronics (FoEE/ICIE)Faculty of Electrical Engineering (FoEE)
Certifying unit
Wydział Elektryczny (FoEE)
Affiliation unit
The Institute of Control and Industrial Electronics (FoEE/ICIE)
Language
(pl) Polish
Status
Finished
Issue date (year)
2012
Keywords in Polish
Keywords in English
Abstract in Polish

Uniform Resource Identifier
https://repo.pw.edu.pl/info/master/WUT085f4c224e414e909fd2f0372cc4a1bb/
URN
urn:pw-repo:WUT085f4c224e414e909fd2f0372cc4a1bb

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