Knowledge base: Warsaw University of Technology

Settings and your account

Back

Application of atomic force microscopy (AFM) for surface characterization of SiC-based structures

Konrad Jaworski

Record ID
WUT02286aad9e3c4400832bceda8573e1ba
Diploma type
Master of Science
Author
Konrad Jaworski (FEIT/MO) Konrad Jaworski,, The Institute of Microelectronics and Optoelectronics (FEIT/MO)Faculty of Electronics and Information Technology (FEIT)
Title in Polish
Zastosowanie mikroskopu AFM do badania powierzchni struktur wytwarzanych w technologii SiC
Supervisor
Jan Szmidt (FEIT/MO) Jan Szmidt,, The Institute of Microelectronics and Optoelectronics (FEIT/MO)Faculty of Electronics and Information Technology (FEIT)
Certifying unit
Faculty of Electronics and Information Technology (FEIT)
Affiliation unit
The Institute of Microelectronics and Optoelectronics (FEIT/MO)
Language
(pl) Polish
Status
Finished
Defense Date
23-03-2012
Issue date (year)
2012

Uniform Resource Identifier
https://repo.pw.edu.pl/info/master/WUT02286aad9e3c4400832bceda8573e1ba/
URN
urn:pw-repo:WUT02286aad9e3c4400832bceda8573e1ba

Confirmation
Are you sure?
Report incorrect data on this page