Proceedings of SPIE: Optical Measurement Systems for Industrial Inspection XI

Peter Lehmann , Wolfgang Osten , Armando Albertazzi Gonçalves Jr.


Book typeMonograph
Editor Peter Lehmann
Peter Lehmann,,
, Wolfgang Osten
Wolfgang Osten,,
, Armando Albertazzi Gonçalves Jr.
Armando Albertazzi Gonçalves Jr.,,
PublisherSPIE – The International Society for Optics and Photonics, MNiSW [80]
Issue year2019
Book series /Journal (in case of Journal special issue)Proceedings of SPIE: The International Society for Optical Engineering, ISSN 0277-786X, e-ISSN 1996-756X, (0 pkt)
ConferenceSPIE Optical Metrology, 24-06-2019 - 27-07-2019, Munich, Niemcy
Languageen angielski
Score (nominal)20
ScoreMinisterial score = 20.0, 10-09-2019, MonograhOrBookMainLanguagesEditor
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