Manufacturing Microwave AlGaN/GaN High electron Mobility Transistors (HEMTs) on Truly Bulk Semi-Insulating GaN Substrates

Anna Piotrowska , Eliana Kamińska , Wojciech Wojtasiak , Wojciech Gwarek , R. Kucharski , M. Zając , Paweł Prystawko , P. Kruszewski , Marek Ekielski , Jakub Kaczmarski , M. Kozubal , A. Trajnerowicz , A. Taube

Abstract

n/a
Author Anna Piotrowska - [Institute of Electron Technology (ITE)]
Anna Piotrowska,,
-
- Instytut Technologii Elektronowej
, Eliana Kamińska - [Institute of Electron Technology (ITE)]
Eliana Kamińska,,
-
- Instytut Technologii Elektronowej
, Wojciech Wojtasiak (FEIT / IRMT)
Wojciech Wojtasiak,,
- The Institute of Radioelectronics and Multimedia Technology
, Wojciech Gwarek (FEIT / IRMT)
Wojciech Gwarek,,
- The Institute of Radioelectronics and Multimedia Technology
, R. Kucharski
R. Kucharski,,
-
, M. Zając
M. Zając,,
-
, Paweł Prystawko
Paweł Prystawko,,
-
, P. Kruszewski
P. Kruszewski,,
-
, Marek Ekielski
Marek Ekielski,,
-
, Jakub Kaczmarski - [Institute of Electron Technology (ITE)]
Jakub Kaczmarski,,
-
- Instytut Technologii Elektronowej
et al.`
Journal seriesECS Transactions, ISSN 1938-5862, [1938-6737, 2151-2051], (0 pkt)
Issue year2016
Vol75
No12
Pages77-84
Publication size in sheets0.5
ASJC Classification2200 General Engineering
ProjectModern methods of analysis and designing of units and radioelectronics systems, medical electronics and measuring systems. Project leader: Modelski Józef, , Phone: +48 22 234 7233, +48 22 8256555, start date 11-04-2016, end date 30-11-2017, IRiTM/2016/Stat, Completed
WEiTI Działalność statutowa
Languageen angielski
Score (nominal)5
ScoreMinisterial score = 0.0, 06-09-2019, ArticleFromJournal
Ministerial score (2013-2016) = 5.0, 06-09-2019, ArticleFromJournal
Publication indicators WoS Citations = 3; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 0.253
Citation count*5 (2019-12-05)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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