Enhancing single-shot fringe pattern phase demodulation using advanced variational image decomposition

Maria Cywińska , Maciej Trusiak , Chao Zuo , Krzysztof Patorski


In many full-field optical metrology techniques, i.e. interferometry, moiré, and structured light, the information about the measurand, e.g. displacement, strain, or 3D shape, is stored in the phase distribution of a recorded two-dimensional intensity pattern—the fringe pattern. Its analysis (phase demodulation) therefore plays a crucial role in the measurement procedure, significantly affecting the total accuracy of the optical system. Phase demodulation methods based on just a single fringe pattern are especially interesting, due to their robustness to environmental disturbances and ability to examine dynamic events. However, the calculated phase map is easily spoiled by errors, which appear mainly because of fringe pattern imperfections, i.e. random noise, parasitic interferences, a nonsinusoidal fringe pattern profile or a non-uniform image background. In this contribution, an advanced variational image decomposition scheme is proposed to reduce these phase demodulation errors. The reported purely phase domain method can be easily adopted to aid virtually any fringe analysis method, including single-frame and multi-frame phase-shifting, possibly enhancing retrieved phase distribution without the need for hardware manipulation. We employed it to improve singleframe Hilbert–Huang transform-based fringe analysis. The remarkable efficiency and versatility of the developed algorithm are verified by processing synthetic and experimental fringe patterns and phase maps. The demonstrated approach compares favorably with the very capable 2D empirical mode decomposition reference method.
Author Maria Cywińska (FM / IMPh)
Maria Cywińska,,
- The Institute of Micromechanics and Photonics
, Maciej Trusiak (FM / IMPh)
Maciej Trusiak,,
- The Institute of Micromechanics and Photonics
, Chao Zuo - Nanjing University of Science and Technology
Chao Zuo,,
, Krzysztof Patorski (FM / IMPh)
Krzysztof Patorski,,
- The Institute of Micromechanics and Photonics
Journal seriesJournal of Optics, ISSN 2040-8978, [2040-8986]
Issue year2019
Pages045702-1 - 045702-19
Publication size in sheets0.3
Keywords in Englishinterferometry, fringe analysis, phase measurement, phase retrieval, phase imaging, phase enhancement
ASJC Classification3107 Atomic and Molecular Physics, and Optics; 2504 Electronic, Optical and Magnetic Materials
URL https://iopscience.iop.org/article/10.1088/2040-8986/ab078e/meta
Languageen angielski
Score (nominal)70
Score sourcejournalList
ScoreMinisterial score = 70.0, 06-07-2020, ArticleFromJournal
Publication indicators WoS Citations = 0; Scopus Citations = 1; GS Citations = 1.0; Scopus SNIP (Source Normalised Impact per Paper): 2018 = 1.033; WoS Impact Factor: 2018 = 2.753 (2) - 2018=2.246 (5)
Citation count*1 (2020-08-10)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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