Microdefects Modeling in Germanium Single Crystals
Piotr Śpiewak , J. Vanhellemont , Krzysztof Kurzydłowski
AbstractThe knowledge of the dynamics of intrinsic point defects, is essential for controlling and engineering their formation and clustering and thus also the quality of the germanium crystals used for producing germanium wafers for space solar cells and terrestrial concentrator photovoltaic, as well as of the active layer of germanium in complementary metal-oxide semiconductors technology. The analyses presented in this paper relate technological process parameters with microdefect formation in single crystal germanium.
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|Book||Udomkichdecha Werasak, Mononukul Anchalee, Böllinghaus Thomas, Lexow Jürgen (eds.): Materials for Energy Infrastructure , 2016, Springer Singapore, ISBN 978-981-287-723-9, 124 p.|
|Score||= 0.0, 28-01-2020, MonographChapterAuthor|
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