Study of Real CMOS Defects Using DefSim Educational Environment
AbstractThe developed experimental and measurement kit called DefSim facilitates the study of physical defects and their influence on the operation of digital circuits. Both the measurement equipment and the remote access mechanism were created in a full custom way in the frame of the European Union project REASON. DefSim can be used as a first step to understanding the behavior of real physical defects and evaluating newly developed fault models and testing methodologies for modern electronics.
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|Book||Lobur Mykhaylo (eds.): Proc. The XIth International Conference. The experience of Designing and Application of CAD Systems in Microelectronics, vol. CFP11508-PRT, 2011, IEEE, ISBN 978-966-2191-16-5, 454 p.|
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