Study of Real CMOS Defects Using DefSim Educational Environment

Witold Pleskacz

Abstract

The developed experimental and measurement kit called DefSim facilitates the study of physical defects and their influence on the operation of digital circuits. Both the measurement equipment and the remote access mechanism were created in a full custom way in the frame of the European Union project REASON. DefSim can be used as a first step to understanding the behavior of real physical defects and evaluating newly developed fault models and testing methodologies for modern electronics.
Author Witold Pleskacz (FEIT / MO)
Witold Pleskacz,,
- The Institute of Microelectronics and Optoelectronics
Pages419-419
Publication size in sheets0.3
Book Lobur Mykhaylo (eds.): Proc. The XIth International Conference. The experience of Designing and Application of CAD Systems in Microelectronics, vol. CFP11508-PRT, 2011, IEEE, ISBN 978-966-2191-16-5, 454 p.
URL http://ieeexplore.ieee.org/document/5744519/
Languageen angielski
Score (nominal)10
Citation count*
Cite
Share Share

Get link to the record


* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
Back
Confirmation
Are you sure?