Modeling the effect of oxide traps on the small-signal admittance of the MOS tunnel diode
Jakub Maciej Jasiński , Bogdan Majkusiak
|Publication size in sheets||0.3|
|Book||Organizing Committee of Conference EUROSOI: Proc. of EUROSOI 2013, 9th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, 2013, France, IEEE France Section , 100 p.|
|Score|| = 10.0, 04-09-2019, BookChapterMatConfByConferenceseries|
= 15.0, 04-09-2019, BookChapterMatConfByConferenceseries
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.