Modeling the effect of oxide traps on the small-signal admittance of the MOS tunnel diode

Jakub Maciej Jasiński , Bogdan Majkusiak

Abstract

n/a
Author Jakub Maciej Jasiński (FEIT / MO)
Jakub Maciej Jasiński,,
- The Institute of Microelectronics and Optoelectronics
, Bogdan Majkusiak (FEIT / MO)
Bogdan Majkusiak,,
- The Institute of Microelectronics and Optoelectronics
Pages1-1
Publication size in sheets0.3
Book Organizing Committee of Conference EUROSOI: Proc. of EUROSOI 2013, 9th Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, 2013, France, IEEE France Section , 100 p.
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 10.0, 04-09-2019, BookChapterMatConfByConferenceseries
Ministerial score (2013-2016) = 15.0, 04-09-2019, BookChapterMatConfByConferenceseries
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