Stresses caused by Cd and Te inclusions in CdMnTe crystals and their impact on charge carrier transport
Authors:
- Anna Wardak,
- Witold Chromiński,
- Anna Reszka,
- Dominika Kochanowska,
- Marta Witkowska-Baran,
- Małgorzata Lewandowska,
- Andrzej Mycielski
Abstract
We present a defect analysis in Cd and Te inclusion regions within Bridgman-grown Cd0.95Mn0.05Te crystals for nuclear detectors. Crystal growth was performed under Cd- or Te-rich conditions so that Cd and Te inclusions could be investigated, respectively. Cathodoluminescence (CL) maps confirm that a Te inclusion does not generate defects in its vicinity, in contrary to a Cd inclusion, which induces microcracks in its neighborhood in the CdMnTe matrix. This originates from the higher thermal expansion coefficient ratio of Cd to the CdTe than Te to CdTe. Next, the relative stress analysis was carried out using the electron backscatter diffraction (EBSD) technique, which shows that a Te inclusion causes higher stresses in its environment than a Cd inclusion does. The reason for this is that the Cd inclusion releases the stresses due to a creation of the tensile cracks. Despite the fact that a Te inclusion stresses the crystal lattice more, it can have a smaller impact on charge carrier transport in nuclear detectors than a Cd inclusion. This effect we confirm by μτ product measurements, which determine charge carrier transport properties.
- Record ID
- WUTe706883c3f79429bbe28c1662f2978f8
- Author
- Journal series
- Journal of Alloys and Compounds, ISSN 0925-8388, e-ISSN 1873-4669
- Issue year
- 2021
- Vol
- 874
- Pages
- 1-8
- Article number
- 159941
- Keywords in English
- Semiconductors; Crystal growth; Microstructure; Inclusions; Scanning electron microscopy SEM
- ASJC Classification
- ; ; ;
- DOI
- DOI:10.1016/j.jallcom.2021.159941 Opening in a new tab
- Language
- eng (en) English
- License
- File
-
- File: 1
- Stresses caused by Cd and Te inclusions in CdMnTe crystals and their impact on charge carrier transport, File 2021 JALCOM Wardak.pdf / 732 KB
- 2021 JALCOM Wardak.pdf
- publication date: 27-04-2021
- Stresses caused by Cd and Te inclusions in CdMnTe crystals and their impact on charge carrier transport, File 2021 JALCOM Wardak.pdf / 732 KB
-
- Score (nominal)
- 100
- Score source
- journalList
- Score
- = 100.0, 04-05-2022, ArticleFromJournal
- Publication indicators
- = 0; : 2018 = 1.386; : 2020 (2 years) = 5.316 - 2020 (5 years) =4.631
Share
- Uniform Resource Identifier
- https://repo.pw.edu.pl/info/article/WUTe706883c3f79429bbe28c1662f2978f8/
- URN
urn:pw-repo:WUTe706883c3f79429bbe28c1662f2978f8
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or PerishOpening in a new tab system.