Analysis of the ensemble of regression algorithms for the analog circuit parametric indentification

Piotr Bilski

Abstract

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Author Piotr Bilski (FEIT / IRMT)
Piotr Bilski,,
- The Institute of Radioelectronics and Multimedia Technology
Journal seriesMeasurement, [Measurement: Journal of the International Measurement Confederation], ISSN 0263-2241, e-ISSN 1873-412X
Issue year2020
Article number107829
ASJC Classification2208 Electrical and Electronic Engineering; 2604 Applied Mathematics; 3104 Condensed Matter Physics; 3105 Instrumentation
DOIDOI:10.1016/j.measurement.2020.107829
URL https://doi.org./10.1016/j.measurement.2020.107829
Languageen angielski
LicenseJournal (articles only); author's original; Uznanie Autorstwa (CC-BY); before publication
Score (nominal)200
Score sourcejournalList
ScoreMinisterial score = 200.0, 22-06-2020, ArticleFromJournal
Publication indicators Scopus Citations = 0; Scopus SNIP (Source Normalised Impact per Paper): 2017 = 1.566; WoS Impact Factor: 2018 = 2.791 (2) - 2018=2.826 (5)
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