RIN measurements of the 850 nm VCSELs

Łukasz Chorchos , Jarosław Piotr Turkiewicz

Abstract

In this paper, the relative intensity noise (RIN) measurements studies of multimode 850nm vertical cavity surface emitting lasers are presented. The used method is based on the RF spectrum measurement of a biased and unmodulated laser. Further a method based on the oscilloscope measurements is applied. The results obtained for both methods are comparable and differ less than 2 dB. The obtained RINs were in the range from -143.87 to -139.45 dB/Hz for various VCSEL biases.
Author Łukasz Chorchos IT
Łukasz Chorchos,,
- The Institute of Telecommunications
, Jarosław Piotr Turkiewicz IT
Jarosław Piotr Turkiewicz,,
- The Institute of Telecommunications
Pages100311E-1 - 100311E-7
Publication size in sheets0.3
Book Romaniuk Ryszard (eds.): Proc. SPIE. 10031, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, vol. 10031, 2016, SPIE , ISBN 9781510604858, [781510604865 (electronic) ], 1170 p., DOI:10.1117/12.2257157
Keywords in EnglishRIN, relative intensity noise, VCSEL, 850 nm
DOIDOI:10.1117/12.2249366
projectThe Develpment of Digital Communicatios. Project leader: Siuzdak Jerzy, , Phone: +48 22 234-7232, start date 27-04-2015, end date 31-12-2016, IT/2015/statut, Completed
WEiTI Działalność statutowa
Languageen angielski
File
2016 Chorchos Turkiewicz RIN measurement.pdf 818.22 KB
Score (nominal)15
ScoreMinisterial score = 15.0, 27-03-2017, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 27-03-2017, BookChapterMatConf
Citation count*1 (2018-06-30)
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