Towards automated, high resolution 3D scanning of large surfaces for cultural heritage documentation

Robert Sitnik , Eryk Bunsch , Grzegorz Mączkowski , Wojciech Załuski , Krzysztof Lech , Jakub Michoński , Jakub Krzesłowski , Piotr Jan Foryś


In this paper we present a 3D imaging system for high-quality documentation of cultural heritage surfaces. The main challenge in this kind of documentation is related to the requirements of high accuracy and resolution for large and complex surfaces. Our test subject was the King's Chinese Cabinet (Museum of King Jan III's Palace at Wilanów) consisting of geometrically complex wall decorations (European lacquer technique). The technical requirements for documentation in the form of clouds of points were: <0.1 mm point to point spatial resolution, <0.05 mm spatial accuracy and color representation in unified lighting conditions (without local reflections from light sources). The total area of walls and ceiling to be covered by the measurements was approximately equal to 96m2. Illumination had to be limited to the visible spectrum only. We developed a structured light measurement head with a group of additional LED illuminators. To speed up the measurement process we mounted the measurement head on a robot arm and integrated their coordinate systems. This step gives us automatic rough view registration within the range of motion of the robot arm. The arm was mounted on a specially developed, moveable and stabilized platform that can be extended to measure surfaces at an altitude of 5,5 meters. In the paper we discuss main aspects connected with development, calibration and data processing related to the measurement process. We also describe main processing algorithms being used. Exemplary result of King's Chinese Cabinet measurement are presented with discussion of main data processing steps.
Author Robert Sitnik IMiF
Robert Sitnik,,
- The Institute of Micromechanics and Photonics
, Eryk Bunsch
Eryk Bunsch,,
, Grzegorz Mączkowski IMiF
Grzegorz Mączkowski,,
- The Institute of Micromechanics and Photonics
, Wojciech Załuski IMiF
Wojciech Załuski,,
- The Institute of Micromechanics and Photonics
, Krzysztof Lech IMiF
Krzysztof Lech,,
- The Institute of Micromechanics and Photonics
, Jakub Michoński IMiF
Jakub Michoński,,
- The Institute of Micromechanics and Photonics
, Jakub Krzesłowski IMiF
Jakub Krzesłowski,,
- The Institute of Micromechanics and Photonics
, Piotr Jan Foryś IMiF
Piotr Jan Foryś,,
- The Institute of Micromechanics and Photonics
Journal seriesIS&T/SPIE Symposium on Electronic Imaging: Science &Technology
Issue year2016
VolVol. 2016
Publication size in sheets2.4
Keywords in English3D documentation, cultural heritage, 3D scanning process
Languageen angielski
Score (nominal)0
ScoreMinisterial score [Punktacja MNiSW] = 0.0, 28-11-2017, ArticleFromJournal
Ministerial score (2013-2016) [Punktacja MNiSW (2013-2016)] = 0.0, 28-11-2017, ArticleFromJournal - czasopismo zagraniczne spoza list
Citation count*1 (2018-06-18)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.