Single-Shot High-Voltage Circuit for Electrical Capacitance Tomograph

Waldemar Smolik , Jacek Kryszyn , Bartłomiej Radzik , Mateusz Stosio , Przemysław Wróblewski , Damian Wanta , Łukasz Dańko , Tomasz Olszewski , Roman Szabatin

Abstract

n/a
Author Waldemar Smolik (FEIT / IRMT)
Waldemar Smolik,,
- The Institute of Radioelectronics and Multimedia Technology
, Jacek Kryszyn (FEIT / IRMT)
Jacek Kryszyn,,
- The Institute of Radioelectronics and Multimedia Technology
, Bartłomiej Radzik - [Warsaw University of Technology (PW)]
Bartłomiej Radzik,,
-
- Politechnika Warszawska
, Mateusz Stosio (FEIT / IRMT)
Mateusz Stosio,,
- The Institute of Radioelectronics and Multimedia Technology
, Przemysław Wróblewski (FEIT / IRMT)
Przemysław Wróblewski,,
- The Institute of Radioelectronics and Multimedia Technology
, Damian Wanta (FEIT / IRMT)
Damian Wanta,,
- The Institute of Radioelectronics and Multimedia Technology
, Łukasz Dańko (FEIT / IRMT)
Łukasz Dańko,,
- The Institute of Radioelectronics and Multimedia Technology
, Tomasz Olszewski (FEIT / IRMT)
Tomasz Olszewski,,
- The Institute of Radioelectronics and Multimedia Technology
, Roman Szabatin (FEIT / IRMT)
Roman Szabatin,,
- The Institute of Radioelectronics and Multimedia Technology
Journal seriesMeasurement Science & Technology, ISSN 0957-0233
Issue year2016
Vol28
No2
Pages1-12
Publication size in sheets1.15
ASJC Classification2604 Applied Mathematics; 3105 Instrumentation
DOIDOI:10.1088/1361-6501/aa50e1
Languageen angielski
LicenseJournal (articles only); author's original; Other open licence; after publication
Score (nominal)35
Score sourcejournalList
ScoreMinisterial score = 30.0, 22-06-2020, ArticleFromJournal
Ministerial score (2013-2016) = 35.0, 22-06-2020, ArticleFromJournal
Publication indicators WoS Citations = 7; Scopus Citations = 20; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 1.234; WoS Impact Factor: 2016 = 1.585 (2) - 2016=1.768 (5)
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