Comparative Study of the Surface Roughness by AFM and GIXR

D. Żymierska , J. Auleytner , Jarosław Domagała , Tomasz Kobiela , R. Duś

Abstract

n/a
Author D. Żymierska - [Institute of Physics of the Polish Academy of Sciences]
D. Żymierska,,
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, J. Auleytner - [Institute of Physics of the Polish Academy of Sciences]
J. Auleytner,,
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, Jarosław Domagała
Jarosław Domagała,,
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, Tomasz Kobiela (FC / IBC / DDTB)
Tomasz Kobiela,,
- Department Of Drug Technology And Biotechnology
, R. Duś - [Institute of Physical Chemistry of the Polish Academy of Sciences]
R. Duś,,
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Journal seriesPhysica Status Solidi A-Applications and Materials Science, ISSN 1862-6300
Issue year2000
Vol180
Pages479-485
ASJC Classification2505 Materials Chemistry; 2208 Electrical and Electronic Engineering; 2508 Surfaces, Coatings and Films; 3110 Surfaces and Interfaces; 3104 Condensed Matter Physics; 2504 Electronic, Optical and Magnetic Materials
Internal identifier4559
Languageen angielski
Score (nominal)25
Score sourcejournalList
Publication indicators Scopus Citations = 8; WoS Citations = 7; GS Citations = 7.0; Scopus SNIP (Source Normalised Impact per Paper): 2014 = 0.901; WoS Impact Factor: 2008 = 1.205 (2) - 2008=1.179 (5)
Citation count*7 (2015-05-11)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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