Charging/discharging processes in nanocrystaline MOS structures - Theoretical study
Dominik Tanous , Andrzej Igor Mazurak , Bogdan Majkusiak
AbstractWe present the study of impact of some parameters of the metal-insulatorsemiconductor structure with nanocrystals embedded in the insulator layer on the currentvoltage and capacitance-voltage characteristics with the bias voltage ramp rate as a parameter. The developed model is used as a tool for theoretical understanding the physics behind charging and discharging processes in the considered structures.
|Journal series||Journal of Physics - Conference Series, ISSN 1742-6588 [1742-6596]|
|Publication size in sheets||0.5|
|Conference||Microtechnology and thermal problems in electronics (MICROTHERM 2015), 23-06-2015 - 25-06-2015, Łódź, Polska|
|project||xxx. Project leader: Beck Romuald,
, Phone: (+48) 22 234 75 34, application date 22-12-2011, start date 30-08-2012, planned end date 29-08-2015, IMiO/2011/NCN/5, Implemented
|Score|| = 15.0, 27-03-2017, ArticleFromJournalAndMatConf|
= 15.0, 27-03-2017, ArticleFromJournalAndMatConf
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