Extraction of Border/Bulk Traps Parameters Based on Admittance Measurements

Jakub Maciej Jasiński , Andrzej Igor Mazurak , Bogdan Majkusiak

Abstract

P 14
Author Jakub Maciej Jasiński (FEIT / MO)
Jakub Maciej Jasiński,,
- The Institute of Microelectronics and Optoelectronics
, Andrzej Igor Mazurak (FEIT / MO)
Andrzej Igor Mazurak,,
- The Institute of Microelectronics and Optoelectronics
, Bogdan Majkusiak (FEIT / MO)
Bogdan Majkusiak,,
- The Institute of Microelectronics and Optoelectronics
Pages1-1
Publication size in sheets0.3
Book Zschech Ehrenfried (eds.): Abstract booklet of 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics-Experiment and Simulation (“Stress Workshop”), 2016, Germany, Fraaunhofer IKTS, 60 p.
Languageen angielski
Score (nominal)0
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