Extraction of Border/Bulk Traps Parameters Based on Admittance Measurements
Jakub Maciej Jasiński , Andrzej Igor Mazurak , Bogdan Majkusiak
|Publication size in sheets||0.3|
|Book||Zschech Ehrenfried (eds.): Abstract booklet of 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics-Experiment and Simulation (“Stress Workshop”), 2016, Fraaunhofer IKTS, 60 p.|
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