Extraction of Border/Bulk Traps Parameters Based on Admittance Measurements
Jakub Maciej Jasiński , Andrzej Igor Mazurak , Bogdan Majkusiak
Abstract
P 14Author | |
Pages | 1-1 |
Publication size in sheets | 0.3 |
Book | Zschech Ehrenfried (eds.): Abstract booklet of 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics-Experiment and Simulation (“Stress Workshop”), 2016, Fraaunhofer IKTS, 60 p. |
Language | en angielski |
Score (nominal) | 0 |
Citation count* |
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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