Technology and characterization of MOS structures with co-doped silicon nanocrystals (Si-NCs) embedded in dielectric ensembles

Robert Paweł Mroczyński , Andrzej Igor Mazurak , Jakub Maciej Jasiński , Romuald Beck , S. Kano , H. Sugimoto , K. Imakita , M. Fujii , J. Valenta

Abstract

E.P1.10
Author Robert Paweł Mroczyński IMiO
Robert Paweł Mroczyński,,
- The Institute of Microelectronics and Optoelectronics
, Andrzej Igor Mazurak IMiO
Andrzej Igor Mazurak,,
- The Institute of Microelectronics and Optoelectronics
, Jakub Maciej Jasiński IMiO
Jakub Maciej Jasiński,,
- The Institute of Microelectronics and Optoelectronics
, Romuald Beck IMiO
Romuald Beck,,
- The Institute of Microelectronics and Optoelectronics
, S. Kano
S. Kano,,
-
, H. Sugimoto
H. Sugimoto,,
-
, K. Imakita
K. Imakita,,
-
, M. Fujii
M. Fujii,,
-
, J. Valenta
J. Valenta,,
-
Pages112-112
Book Barbier Daniel, Tomm Jens W., Boyd Ian W., Godlewski Marek (eds.): E-MRS Fall Meeting 2016, 2016, EMRS, 481 p.
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 15.0, 27-03-2017, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 27-03-2017, BookChapterMatConf
Citation count*0
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