Sensing properties of micro-cavity in-line Mach-Zehnder interferometer enhanced by reactive ion etching
Monika Janik , Marcin Koba , Anna Celebańska , Wojtek J. Bock , Mateusz Jakub Śmietana
Abstract[INVITED] In this work, we discuss an application of reactive ion etching (RIE) for enhancing the sensing properties of a micro-cavity in-line Mach-Zehnder interferometer (µIMZI). The µIMZI was fabricated using femtosecond laser micromachining in a standard single-mode fiber as a circular hole with a diameter of 54 µm. Next, the structures underwent two kinds of RIE using as reactive gases: sulfur hexafluoride (SF6) and oxygen (O2) mixtures (SF6/O2) or O2 itself. When RIE with SF6/O2 was applied, it allowed for an efficient and well-controlled etching of the fabricated structure at nanometers level observed as an increase in spectral depths of the minima in the µIMZI transmission spectrum. A similar RIE process with O2 alone was ineffective. The well-defined minima obtained with the SF6/O2 RIE significantly improved the resolution of measurements made with the µIMZI. The effect was demonstrated for high-resolution refractive index (RI) measurements of liquids in the cavity. The result of the RIE process was to clean the micro-cavity bottom, increase its depth, and smooth its sidewalls. As an additional effect, the wettability of the micro-cavity surface was improved, making the RI measurements faster and more repeatable. Moreover, we demonstrated that RIE with SF6/O2 results in more stable wettability improvement than when O2 is applied as a reactive gas.
|Journal series||Optics and Laser Technology, ISSN 0030-3992, (A 30 pkt)|
|Publication size in sheets||0.5|
|ASJC Classification||; ;|
|Project||x. Project leader: Śmietana Mateusz Jakub,
, Phone: (22) 234 63 64, start date 25-02-2015, planned end date 24-02-2018, IMIO/2015/NCN/1, Implemented
|Score||= 30.0, 27-12-2019, ArticleFromJournal|
|Publication indicators||= 1; = 0; = 2.0; : 2017 = 1.434; : 2018 = 3.319 (2) - 2018=2.643 (5)|
|Citation count*||2 (2020-01-04)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.