Correlating software metrics with software defects

Maciej Korpalski , Janusz Sosnowski


In software development and testing an interesting issue is checking correlations of observed software defects with various product and process metrics. Such analysis is helpful in predicting potential defects and optimization of testing processes. In the paper we present results of deeper studies in this area, they involve many metrics and various prediction schemes taking into account diverse correlation parameters. Special attention is paid to the problem of selecting most significant metrics. In the prediction schemes we consider modified and non modified program objects. The presented analysis methods have been verified in an experimental investigation covering twelve open source projects, for some of them several subsequent versions have been examined. This is followed by result discussion.
Author Maciej Korpalski (FEIT / ICS)
Maciej Korpalski,,
- The Institute of Computer Science
, Janusz Sosnowski (FEIT / IN)
Janusz Sosnowski,,
- The Institute of Computer Science
Publication size in sheets0.5
Book Romaniuk Ryszard, Linczuk Maciej Grzegorz (eds.): Proceedings of SPIE: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, Proceedings of SPIE: The International Society for Optical Engineering, vol. 10808, 2018, SPIE - the International Society for Optics and Photonics, ISBN 9781510622036, 2086 p., DOI:10.1117/12.2504983
Keywords in EnglishSoftware metrics, defect prediction, software reliability, empirical study
projectDevelopment of new algorithms in the areas of software and computer architecture, artificial intelligence and information systems and computer graphics . Project leader: Arabas Jarosław, , Phone: +48 22 234 7432, start date 01-06-2017, end date 31-10-2018, II/2017/DS/1, Completed
WEiTI Działalność statutowa
Languageen angielski
108081P_Korpalski.pdf 203.19 KB
Score (nominal)15
ScoreMinisterial score = 15.0, BookChapterSeriesAndMatConf
Ministerial score (2013-2016) = 15.0, BookChapterSeriesAndMatConf
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