Raman studies of C-Ni/Ti films deposited on Si (100)
R. Belka , J. Keczkowska , Małgorzata Suchańska , Piotr Firek , Halina Wronka , Joanna Radomska , Elżbieta Czerwosz
AbstractThe thin films of carbon-nickel (C-Ni) nanocoposites were deposited on Ti-evaporated Si (100) substrate using Physical Vapour Deposition (PVD) method. Influence of evaporated titanium on carbonaceous structure of C-Ni films were investigated by Raman spectroscopy method. The fullerite-graphite structure was recognize using principal component analysis (PCA) of obtained Raman spectra. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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