Raman studies of C-Ni/Ti films deposited on Si (100)

R. Belka , J. Keczkowska , Małgorzata Suchańska , Piotr Firek , Halina Wronka , Joanna Radomska , Elżbieta Czerwosz


The thin films of carbon-nickel (C-Ni) nanocoposites were deposited on Ti-evaporated Si (100) substrate using Physical Vapour Deposition (PVD) method. Influence of evaporated titanium on carbonaceous structure of C-Ni films were investigated by Raman spectroscopy method. The fullerite-graphite structure was recognize using principal component analysis (PCA) of obtained Raman spectra. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Author R. Belka
R. Belka,,
, J. Keczkowska
J. Keczkowska,,
, Małgorzata Suchańska
Małgorzata Suchańska,,
, Piotr Firek (FEIT / MO)
Piotr Firek,,
- The Institute of Microelectronics and Optoelectronics
, Halina Wronka
Halina Wronka,,
, Joanna Radomska
Joanna Radomska,,
, Elżbieta Czerwosz
Elżbieta Czerwosz,,
Pages966249, 1-7
Book Romaniuk Ryszard (eds.): Proceedings of SPIE, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments, vol. 9662, 2015, SPIE, ISBN 9781628418804, 24 p., DOI:10.1117/12.2209163
URL http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2442324
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 15.0, 10-03-2019, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 10-03-2019, BookChapterMatConf
Citation count*1 (2019-04-19)
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