In-depth Study of Nanocrystalline Ru-Si-O as Schottky Electrode for Nitride Semicon-ductors

Jakub Kaczmarski , A. Taube , T. Boll , Marek Ekielski , Renata Kruszka , Michał A. Borysiewicz , Marcin Myśliwiec , K. Piskorski , Marek Wzorek , M. Kozubal , Wojciech Wojtasiak , Dawid Kuchta , Marcin Góralczyk , Paweł Prystawko , M. Zając , R. Kucharski , K. Stiller , Eliana Kamińska

Abstract

n/a
Author Jakub Kaczmarski
Jakub Kaczmarski,,
-
, A. Taube - [Institute of Electron Technology (ITE)]
A. Taube,,
-
- Instytut Technologii Elektronowej
, T. Boll
T. Boll,,
-
, Marek Ekielski
Marek Ekielski,,
-
, Renata Kruszka - [Institute of Electron Technology (ITE)]
Renata Kruszka,,
-
- Instytut Technologii Elektronowej
, Michał A. Borysiewicz - [Institute of Electron Technology]
Michał A. Borysiewicz,,
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- Institute of Electron Technology
, Marcin Myśliwiec IMiO
Marcin Myśliwiec,,
- The Institute of Microelectronics and Optoelectronics
, K. Piskorski
K. Piskorski,,
-
, Marek Wzorek
Marek Wzorek,,
-
, M. Kozubal - Institute of Electron Technology (ITE)
M. Kozubal,,
-
et al.`
Pages1-5
Publication size in sheets0.5
Book Barbier Daniel, Tomm Jens W., Boyd Ian W., Godlewski Marek (eds.): E-MRS Fall Meeting 2016, 2016, EMRS, 481 p.
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 15.0, 27-03-2017, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 27-03-2017, BookChapterMatConf
Citation count*0 (2018-06-30)
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