On-wafer Measurements of Responsivity of FET-based Sub-THz Detectors

Paweł Kopyt , Bartłomiej Wacław Salski , Piotr Zbigniew Zagrajek , M. Bauwens , N.S. Barker , D. Obrębski , J. Marczewski


Author Paweł Kopyt (FEIT / IRMT)
Paweł Kopyt,,
- The Institute of Radioelectronics and Multimedia Technology
, Bartłomiej Wacław Salski (FEIT / IRMT)
Bartłomiej Wacław Salski,,
- The Institute of Radioelectronics and Multimedia Technology
, Piotr Zbigniew Zagrajek
Piotr Zbigniew Zagrajek,,
, M. Bauwens
M. Bauwens,,
, N.S. Barker
N.S. Barker,,
, D. Obrębski
D. Obrębski,,
, J. Marczewski
J. Marczewski,,
Publication size in sheets0.5
Book Proc. 2018 IEEE MTT-S International Microwave Symposium, 2018, ISBN 9781538663479, 716 p.
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 15.0, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, BookChapterMatConf
Publication indicators WoS Citations = 0
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