Phase imaging quality improvement by modification of AFM probes’ cantilever
Jakub Skibiński , Janusz Rębiś , Ł. Kaczmarek , Tomasz Wejrzanowski , Tomasz Płociński , Krzysztof Rożniatowski
AbstractImaging of the surface of materials by atomic force microscopy under tapping and phase imaging mode, with use of modified probes is addressed. In this study, the circularly shaped holes located in varying distance from the probe base, were cut out by focused ion beam. Such modification was a consequence of the results of the previous experiments (probe tip sharpen- ingandcantileverthinning)wheresignificantimprovementof imagequality in tapping and phase imaging mode has been revealed. The solution proposed herein gives similar results, but is much simpler from the technological point of view. Shorter exposition time of the tip onto gallium ions during FIB processing allows to reduce material degradation. The aim of this modification was to change harmonic oscillators’ properties in the simplest and fastest way, to obtain stronger signal for higher resonant frequencies, which can be advantageous for improvingthequalityofimaginginPImode.Probesshapedin that way were used for AFM investigations with Bruker AFM nanoscope 8. As a testing material, titanium roughness standard sample, supplied by Bruker, was used. The results have shown that the modifications performed within these studies influence the oscillation of the probes, which in some cases may result in deterioration of the imaging quality under tapping mode for one or both selfresonant frequencies.However, phase imaging results obtained using modified probes are of higher quality. The numerical simulations performer by application of finite element method were used to explain the results obtained experimentally. Phenomenon described within this study allows to apply developed modelling methodology for prediction of effects of various modifications on the probes’tip, and as a result, to predict how proposed modifications will affect AFM imaging quality.
|Journal series||Journal of Microscopy, ISSN 0022-2720, (A 35 pkt)|
|Pages||179 - 186|
|Publication size in sheets||0.5|
|Keywords in English||AFM, FIB modification, finite element method, modal analysis, nanomachining|
|Publication indicators||: 2016 = 1.692 (2) - 2016=2.025 (5)|
|Citation count*||1 (2019-01-01)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.