Automated Parametric Fault Detection in Complex Analog Systems Based on a Method of Minimum Node Selection

Adrian Bilski , Jacek Wojciechowski

Abstract

n/a
Author Adrian Bilski
Adrian Bilski,,
-
, Jacek Wojciechowski IRTM
Jacek Wojciechowski,,
- The Institute of Radioelectronics and Multimedia Technology
Journal seriesInternational Journal of Applied Mathematics & Computer Science, ISSN 1641-876X
Issue year2016
Vol26
No3
Pages655-668
Publication size in sheets0.65
Languageen angielski
Score (nominal)25
ScoreMinisterial score = 25.0, 27-03-2017, ArticleFromJournal
Ministerial score (2013-2016) = 25.0, 27-03-2017, ArticleFromJournal
Publication indicators WoS Impact Factor: 2016 = 1.42 (2) - 2016=1.597 (5)
Citation count*0
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