Simulation of laser correction of thick film resistors with the boundary elements method use

Michał Borecki , Jerzy Kruszewski , K. Kopczyñski

Abstract

The laser correction of resistors is widely used nowadays in hybrid circuit production. In the article the Boundary Element Method (BEM) is presented as a way of simulation of laser correction cutting of thick layer resistors. The paper also shows the difference between the simulation of correction cutting and the simulation of laser correction interpreted as a technological process. In reality, only the process simulation enables correct setup of its parameters and as a result allows avoiding costly experiments connected with production of big number of test runs.
Author Michał Borecki (FEIT / MO)
Michał Borecki,,
- The Institute of Microelectronics and Optoelectronics
, Jerzy Kruszewski (FEIT / MO)
Jerzy Kruszewski,,
- The Institute of Microelectronics and Optoelectronics
, K. Kopczyñski - [Wojskowa Akademia Techniczna]
K. Kopczyñski,,
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Journal seriesElectron Technology, ISSN 0070-9816
Issue year2000
Vol33
No4
Pages571-576
Publication size in sheets0.5
ASJC Classification2200 General Engineering
Languageen angielski
Score (nominal)0
Score sourcejournalList
Publication indicators Scopus Citations = 1; Scopus SNIP (Source Normalised Impact per Paper) [Not active]: 2003 = 0
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