Simulation of laser correction of thick film resistors with the boundary elements method use
Michał Borecki , Jerzy Kruszewski , K. Kopczyñski
AbstractThe laser correction of resistors is widely used nowadays in hybrid circuit production. In the article the Boundary Element Method (BEM) is presented as a way of simulation of laser correction cutting of thick layer resistors. The paper also shows the difference between the simulation of correction cutting and the simulation of laser correction interpreted as a technological process. In reality, only the process simulation enables correct setup of its parameters and as a result allows avoiding costly experiments connected with production of big number of test runs.
|Journal series||Electron Technology, ISSN 0070-9816|
|Publication size in sheets||0.5|
|Publication indicators||= 1; : 2003 = 0|
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