Adaptive automatic data analysis in full-field fringe pattern based optical metrology

Maciej Trusiak , Krzysztof Patorski , Łukasz Służewski , Krzysztof Pokorski , Zofia Sunderland

Abstract

Fringe pattern processing and analysis is an important task of full-field optical measurement techniques like interferometry, digital holography, structural illumination and moiré. In this contribution we present several adaptive automatic data analysis solutions based on the notion of Hilbert-Huang transform for measurand retrieval via fringe pattern phase and amplitude demodulation. The Hilbert-Huang transform consists of 2D empirical mode decomposition algorithm and Hilbert spiral transform analysis. Empirical mode decomposition adaptively dissects a meaningful number of same-scale subimages from the analyzed pattern - it is a data-driven method. Appropriately managing this set of unique subimages results in a very powerful fringe pre-filtering tool. Phase/amplitude demodulation is performed using Hilbert spiral transform aided by the local fringe orientation estimator. We describe several optical measurement techniques for technical and biological objects characterization basing on the especially tailored Hilbert-Huang algorithm modifications for fringe pattern denoising, detrending and amplitude/phase demodulation
Author Maciej Trusiak IMiF
Maciej Trusiak,,
- The Institute of Micromechanics and Photonics
, Krzysztof Patorski IMiF
Krzysztof Patorski,,
- The Institute of Micromechanics and Photonics
, Łukasz Służewski WM
Łukasz Służewski,,
- Faculty of Mechatronics
, Krzysztof Pokorski IMiF
Krzysztof Pokorski,,
- The Institute of Micromechanics and Photonics
, Zofia Sunderland IMiF
Zofia Sunderland,,
- The Institute of Micromechanics and Photonics
Pages1014209-1014209-12
Publication size in sheets0.3
Book Müllerová Jarmila (eds.): Volume 10142 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2016, SPIE, ISBN 9781510607347
Keywords in EnglishData analysis; Fringe analysis; Optical metrology; Demodulation; Denoising; Digital holography; Interferometry
DOIDOI:10.1117/12.2263355
URL http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2595345
Languageen angielski
Score (nominal)15
ScoreMinisterial score = 15.0, 08-02-2017, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 08-02-2017, BookChapterMatConf
Citation count*1 (2018-02-18)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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