Ferromagnetic Linewidth Measurements Employing Electrodynamic Model of the Magnetic Plasmon Resonance

Jerzy Krupka , Pavlo Aleshkevych , Bartłomiej Wacław Salski , Paweł Kopyt

Abstract

The mode of uniform precession, or Kittel mode, in a magnetized ferromagnetic sphere, has recently been proven to be the magnetic plasmon resonance. In this paper we show how to apply the electrodynamic model of the magnetic plasmon resonance for accurate measurements of the ferromagnetic resonance linewidth ΔH. Two measurement methods are presented. The first one employs Q-factor measurements of the magnetic plasmon resonance coupled to the resonance of an empty metallic cavity. Such coupled modes are known as magnon-polariton modes, i.e. hybridized modes between the collective spin excitation and the cavity excitation. The second one employs direct Q-factor measurements of the magnetic plasmon resonance in a filter setup with two orthogonal semi-loops used for coupling. Q-factor measurements are performed employing a vector network analyser. The methods presented in this paper allow one to extend the measurement range of the ferromagnetic resonance linewidth ΔH well beyond the limits of the commonly used measurement standards in terms of the size of the samples and the lowest measurable linewidths. Samples that can be measured with the newly proposed methods may have larger size as compared to the size of samples that were used in the standard methods restricted by the limits of perturbation theory.
Author Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, Pavlo Aleshkevych
Pavlo Aleshkevych,,
-
, Bartłomiej Wacław Salski (FEIT / IRMT)
Bartłomiej Wacław Salski,,
- The Institute of Radioelectronics and Multimedia Technology
, Paweł Kopyt (FEIT / IRMT)
Paweł Kopyt,,
- The Institute of Radioelectronics and Multimedia Technology
Journal seriesMeasurement Science & Technology, ISSN 0957-0233, (A 30 pkt)
Issue year2018
Vol29
No2
Pages1-10
Publication size in sheets0.5
DOIDOI:10.1088/1361-6501/aa990a
URL http://iopscience.iop.org/article/10.1088/1361-6501/aa990a
projectHigh-precision techniques of millimeter and sub-Thz band characterization of materials for microelectronics. Project leader: Krupka Jerzy, , Phone: (+48) 22 234 7693, start date 01-11-2016, planned end date 31-10-2019, IRiTM/2016/12, Implemented
WEiTI Program Operacyjny Inteligentny Rozwój (PO IR)
Languageen angielski
LicenseJournal (articles only); author's original; Other open licence; after publication
Score (nominal)35
ScoreMinisterial score = 30.0, 30-01-2018, ArticleFromJournal
Ministerial score (2013-2016) = 35.0, 30-01-2018, ArticleFromJournal
Publication indicators WoS Impact Factor: 2016 = 1.585 (2) - 2016=1.768 (5)
Citation count*3 (2018-11-17)
Additional fields
numer pracy025501
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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