Measurements of susceptibility due to paramagnetic impurities in sapphire using whispering gallery modes

A.G. Mann , Jerzy Krupka

Abstract

The microwave susceptibility due to paramagnetic impurities in monocrystalline sapphire has been evaluated based on measurements of the resonant frequency shifts of several whispering gallery modes (WGM) from the normal to the saturated spin state. Spin saturation was achieved by employing a microwave source at a frequency close to the frequency of electron spin resonance for the specific paramagnetic ions. The microwave susceptibility due to the presence of Cr+3 ions was measured and it proved to be highly anisotropic having the dominant component in the plane perpendicular to the anisotropy axis (C-axis) of sapphire crystal.

Author A.G. Mann - [University of Western Australia]
A.G. Mann,,
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, Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
Pages421-424
Publication size in sheets0.5
Book Proc. XIIIth International Conference on Microwaves, Radar and Wireless Communications: MIKON’2000, 2000
DOIDOI:10.1109/MIKON.2000.913960
Languageen angielski
Score (nominal)0
Publication indicators Scopus Citations = 5; WoS Citations = 0; GS Citations = 5.0
Citation count*5 (2020-09-06)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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