Surface characterization of graphene based materials

Marcin Pisarek , Marcin Hołdyński , Mirosław Krawczyk , Robert Nowakowski , Agata Roguska , Artur Małolepszy , Leszek Stobiński , Aleksander Jabłoński

Abstract

In the present study, two kind of samples were used: (i) a monolayer graphene film with a thickness of 0.345 nm deposited by the CVD method on Cu foil, (ii) graphene flakes obtained by modified Hummers method and followed by reduction of graphene oxide. The inelastic mean free path (IMFP), characterizing electron transport in graphene/Cu sample and reduced graphene oxide material, which determines the sampling depth of XPS and AES were evaluated from relative Elastic Peak Electron Spectroscopy (EPES) measurements with the Au standard in the energy range 0.5–2 keV. The measured IMFPs were compared with IMFPs resulting from experimental optical data published in the literature for the graphite sample. The EPES IMFP values at 0.5 and 1.5 keV was practically identical to that calculated from optical data for graphite (less than 4% deviation). For energies 1 and 2 keV, the EPES IMFPs for rGO were deviated up to 14% from IMFPs calculated using the optical data by Tanuma et al. [1]. Before EPES measurements all samples were characterized by various techniques like: FE-SEM, AFM, XPS, AES and REELS to visualize the surface morphology/topography and identify the chemical composition.
Author Marcin Pisarek - Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN)
Marcin Pisarek,,
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, Marcin Hołdyński - Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN)
Marcin Hołdyński,,
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, Mirosław Krawczyk - Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN)
Mirosław Krawczyk,,
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, Robert Nowakowski - [Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN)]
Robert Nowakowski,,
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- Instytut Chemii Fizycznej Polskiej Akademii Nauk
, Agata Roguska - [Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN) [Polska Akademia Nauk (PAN)]]
Agata Roguska,,
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- Instytut Chemii Fizycznej Polskiej Akademii Nauk
, Artur Małolepszy (FCPE / GL)
Artur Małolepszy,,
- WUT Grafen Laboratory
, Leszek Stobiński (FCPE / GL)
Leszek Stobiński,,
- WUT Grafen Laboratory
, Aleksander Jabłoński - Institute of Physical Chemistry Polish Academy of Sciences (IChF PAN) [Polska Akademia Nauk (PAN)]
Aleksander Jabłoński,,
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Journal seriesApplied Surface Science, ISSN 0169-4332, (A 35 pkt)
Issue year2016
Vol388, Part B
Pages696-703
Publication size in sheets0.5
Conference12th International Symposium on Electrochemical/ Chemical Reactivity of New Materials - „Surface Science - key to understand advanced materials” (ECRNM 12), 15-09-2015 - 18-09-2015, Warszawa, Polska
Keywords in Englishgraphene reduced graphene oxide (rGO), elastic-peak electron spectroscopy (EPES), electron inelastic mean free path (IMFP), surface analysis (AES, REELS, XPS)
ASJC Classification2508 Surfaces, Coatings and Films
DOIDOI:10.1016/j.apsusc.2016.02.169
URL http://www.sciencedirect.com/science/article/pii/S0169433216303476
Languageen angielski
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Pisarek M. (i in.) - Surface characterization of....pdf 2.67 MB
Score (nominal)35
ScoreMinisterial score = 35.0, 05-09-2019, ArticleFromJournalAndMatConfByConferenceseries
Ministerial score (2013-2016) = 35.0, 05-09-2019, ArticleFromJournalAndMatConfByConferenceseries
Publication indicators WoS Citations = 5; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 1.225; WoS Impact Factor: 2016 = 3.387 (2) - 2016=3.184 (5)
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