Estimation of the Usefulness of Test Vector Components for Detecting Faults Resulting from Shorts in Standard Cells

Mykola Blyzniuk , Witold Pleskacz , Mykhaylo Lobur , Wiesław Kuźmicz

Abstract

This paper proposes a new methodology for estimation of effectiveness of the test vector components for detecting faults resulting from shorts in digital CMOS standard cells. This methodology is based on the developed approach of identification and probability of occurrence estimation of different types functional faults caused by spot defects in conductive layers of VLSI circuit layout. The application of this methodology is demonstrated. Estimation of usefulness of the test vector components for detecting identified functional faults resulting from shorts in digital gates from an industrial standard cell library has been shown.
Author Mykola Blyzniuk
Mykola Blyzniuk,,
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, Witold Pleskacz (FEIT / MO)
Witold Pleskacz,,
- The Institute of Microelectronics and Optoelectronics
, Mykhaylo Lobur - Lviv Polytechnic National University
Mykhaylo Lobur,,
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, Wiesław Kuźmicz (FEIT / MO)
Wiesław Kuźmicz,,
- The Institute of Microelectronics and Optoelectronics
Pages527-532
Publication size in sheets0.5
Book Napieralski Andrzej (eds.): Proceedings of the 7th International Conference: Mixed Design of Integrated Circuits and Systems MIXDES 2000, 2000, Łódź, Poland, Technical University of Łódź, ISBN 83-87202-37-1, 592 p.
Languageen angielski
Score (nominal)0
Publication indicators GS Citations = 10.0
Citation count*10 (2015-10-23)
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