Investigation of Influence of Measurement Conditions on Accuracy of Material Characterization in sub-THz Frequency Range

Konrad Godziszewski , Yevhen Yashchyshyn

Abstract

n/a
Author Konrad Godziszewski IRTM
Konrad Godziszewski,,
- The Institute of Radioelectronics and Multimedia Technology
, Yevhen Yashchyshyn IRTM
Yevhen Yashchyshyn,,
- The Institute of Radioelectronics and Multimedia Technology
Pages1-4
Publication size in sheets0.5
Book Organizing Committee of Conference MIKON: Proc. 21st International Conference on Microwaves, Radar and Wireless Communications, 2016, IEEE, ISBN 9781509022151, 732 p.
DOIDOI:10.1109/MIKON.2016.7491939
Languageen angielski
LicenseJournal (articles only); author's original; Other open licence; after publication
Score (nominal)15
ScoreMinisterial score = 15.0, 27-03-2017, BookChapterMatConf
Ministerial score (2013-2016) = 15.0, 27-03-2017, BookChapterMatConf
Citation count*3 (2018-07-14)
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