Estimation of Probability of Different Functional Faults Caused by Spot Defects in VLSI Circuits

M. Blyzniuk , Witold Pleskacz , M. Lobur , Wiesław Kuźmicz

Abstract

In this paper we consider practical approach for identification of types of functional faults caused by shorts in conductive layers of IC layout and estimation of probability of occurrence of identified faults.
Author M. Blyzniuk
M. Blyzniuk,,
-
, Witold Pleskacz (FEIT / MO)
Witold Pleskacz,,
- The Institute of Microelectronics and Optoelectronics
, M. Lobur
M. Lobur,,
-
, Wiesław Kuźmicz (FEIT / MO)
Wiesław Kuźmicz,,
- The Institute of Microelectronics and Optoelectronics
Pages47-49
Publication size in sheets0.3
Book Proc. International Conference on Modern Problems of Telecommunications, Computer Science and Engineers Training TCSET 2000, 2000
Languageen angielski
Score (nominal)0
Publication indicators GS Citations = 12.0
Citation count*12 (2015-10-23)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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