Estimation of Probability of Different Functional Faults Caused by Spot Defects in VLSI Circuits
M. Blyzniuk , Witold Pleskacz , M. Lobur , Wiesław Kuźmicz
AbstractIn this paper we consider practical approach for identification of types of functional faults caused by shorts in conductive layers of IC layout and estimation of probability of occurrence of identified faults.
|Publication size in sheets||0.3|
|Book||Proc. International Conference on Modern Problems of Telecommunications, Computer Science and Engineers Training TCSET 2000, 2000|
|Publication indicators||= 12.0|
|Citation count*||12 (2015-10-23)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.