Modeling of the influence of deep majority carrier traps on photo-induced current transients in Cu(In, Ga)Se2 layers
Marek Maciaszek , Paweł Zabierowski
|Publication size in sheets||0.3|
|Book||2013 IEEE 39th Photovoltaic Specialists Conference, 2013, IEEE, DOI:10.1109/PVSC.2013.6744984|
|Score|| = 10.0, 29-12-2019, BookChapterMatConfByIndicator|
= 15.0, 29-12-2019, BookChapterMatConfByIndicator
|Publication indicators||= 0; = 0|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.