Synthesis and structural characterization of microcrystalline Ga2S3 layers on a GaP semiconductor substrate

Cezariusz Jastrzębski , Daniel Jastrzebski , Vitali Kozak , Karolina Pietak , Michał Wierzbicki , Wojciech Gębicki

Abstract

n/a
Author Cezariusz Jastrzębski (FP / SRD)
Cezariusz Jastrzębski,,
- Structural Research Division
, Daniel Jastrzebski
Daniel Jastrzebski,,
-
, Vitali Kozak
Vitali Kozak,,
-
, Karolina Pietak
Karolina Pietak,,
-
, Michał Wierzbicki (FP / SRD)
Michał Wierzbicki,,
- Structural Research Division
, Wojciech Gębicki (FP / SRD)
Wojciech Gębicki,,
- Structural Research Division
Journal seriesMaterials Science in Semiconductor Processing, ISSN 1369-8001, e-ISSN 1873-4081, (N/A 70 pkt)
Issue year2019
Vol94
Pages80-85
Publication size in sheets0.5
ASJC Classification2210 Mechanical Engineering; 2211 Mechanics of Materials; 2500 General Materials Science; 3104 Condensed Matter Physics
DOIDOI:10.1016/j.mssp.2019.01.029
Languageen angielski
Score (nominal)70
Score sourcejournalList
ScoreMinisterial score = 70.0, 20-12-2019, ArticleFromJournal
Publication indicators GS Citations = 2.0; WoS Citations = 1; Scopus SNIP (Source Normalised Impact per Paper): 2017 = 0.992; WoS Impact Factor: 2018 = 2.722 (2) - 2018=2.568 (5)
Citation count*3 (2020-03-26)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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