Characterization of silicon in the terahertz

Min Wan , Yevhen Yashchyshyn , Konrad Godziszewski

Abstract

n/a
Author Min Wan
Min Wan,,
-
, Yevhen Yashchyshyn (FEIT / IRMT)
Yevhen Yashchyshyn,,
- The Institute of Radioelectronics and Multimedia Technology
, Konrad Godziszewski (FEIT / IRMT)
Konrad Godziszewski,,
- The Institute of Radioelectronics and Multimedia Technology
Total number of authors6
Pages1-8
Publication size in sheets0.5
Book Sadwick Laurence P., Yang Tianxin (eds.): Proc. of SPIE 11279, vol. 11279, 2020, SPIE - The International Society for Optics and Photonics
Languageen angielski
Score (nominal)0
Score sourceconferenceList
ScoreMinisterial score = 0.0, 15-04-2020, ChapterFromConference
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