Sequential pattern recognition for medical records analysis

Andrzej Tolarczyk , Krzysztof Siwek

Abstract

n/a
Author Andrzej Tolarczyk IETSIP
Andrzej Tolarczyk,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Krzysztof Siwek IETSIP
Krzysztof Siwek,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
Pages1-3
Book 17th International Conference onComputational Problems of Electrical Engineering (CPEE 2016), vol. 17, 2016, ISBN 978-1-5090-2800-9
Languageen angielski
Score (nominal)15
ScoreMinisterial score [Punktacja MNiSW] = 15.0, 02-02-2018, BookChapterMatConf
Ministerial score (2013-2016) [Punktacja MNiSW (2013-2016)] = 15.0, 02-02-2018, BookChapterMatConf
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