Sequential pattern recognition for medical records analysis

Andrzej Tolarczyk , Krzysztof Siwek

Abstract

n/a
Author Andrzej Tolarczyk (FoEE / ITEEMIS)
Andrzej Tolarczyk,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Krzysztof Siwek (FoEE / ITEEMIS)
Krzysztof Siwek,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
Pages1-3
Book 17th International Conference onComputational Problems of Electrical Engineering (CPEE 2016), vol. 17, 2016, ISBN 978-1-5090-2800-9
Languageen angielski
Score (nominal)15
Score sourceconferenceIndex
ScoreMinisterial score = 15.0, 09-06-2020, BookChapterMatConfByConferenceseries
Ministerial score (2013-2016) = 15.0, 09-06-2020, BookChapterMatConfByConferenceseries
Publication indicators WoS Citations = 0; Scopus Citations = 0
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