Automatyczna detekcja twarzy w obrazie

Marcin Kołodziej , Andrzej Majkowski , Michał Nasternak , Remigiusz Rak

Abstract

n/a
Author Marcin Kołodziej (FoEE / ITEEMIS)
Marcin Kołodziej,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Andrzej Majkowski (FoEE / ITEEMIS)
Andrzej Majkowski,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Michał Nasternak
Michał Nasternak,,
-
, Remigiusz Rak (FoEE / ITEEMIS)
Remigiusz Rak,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
Pages339-340
Book Adamczak Stanisław (eds.): VI Kongres Metrologii, 2013, Kielce-Sandomierz, Politechnika Świętokrzyska, ISBN 9788363792404, 368 p.
Languagepl polski
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