Exploration of Noisy Data in Differential Electronic Nose

Stanisław Osowski , Krzysztof Siwek , Tomasz Grzywacz

Abstract

n/a
Author Stanisław Osowski (FoEE / ITEEMIS)
Stanisław Osowski,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Krzysztof Siwek (FoEE / ITEEMIS)
Krzysztof Siwek,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
, Tomasz Grzywacz (FoEE / ITEEMIS)
Tomasz Grzywacz,,
- The Institute of the Theory of Electrical Engineering, Measurement and Information Systems
Journal seriesCompel-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, ISSN 0332-1649
Issue year2016
Vol35
Pages1382 - 1392
ASJC Classification2604 Applied Mathematics; 2208 Electrical and Electronic Engineering; 1703 Computational Theory and Mathematics; 1706 Computer Science Applications
Languageen angielski
Score (nominal)15
Score sourcejournalList
ScoreMinisterial score = 15.0, 29-06-2020, ArticleFromJournal
Ministerial score (2013-2016) = 15.0, 29-06-2020, ArticleFromJournal
Publication indicators WoS Citations = 0; Scopus Citations = 0; Scopus SNIP (Source Normalised Impact per Paper): 2016 = 0.423; WoS Impact Factor: 2016 = 0.487 (2) - 2016=0.496 (5)
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