Application of scanning microscopy to study correlation between thermal properties and morphology of BaTiO3 thin films

Anna Kaźmierczak-Bałata , Jerzy Bodzenta , Maciej Krzywiecki , Justyna Juszczyk , Jan Szmidt , Piotr Firek

Abstract

We demonstrate the application of the Scanning Thermal Microscopy to quantitative characterization of the thermal properties of barium titanate (BaTiO3) thin films. The results showed that the thermal properties of thin films depend on deposition parameters and can be modified by the annealing of the sample. Microscopic investigations provided information about morphology of non-annealed and annealed layers. The non-annealed layer consists of uniformly distributed, relatively small grains, while in the annealed sample bigger crystallites packed into randomly distributed islands occur. Thermal images revealed that the samples are thermally uniform and, similarly to the atomic force microscopy results, confirmed the grained structure of the annealed sample. The thermal conductivities of BaTiO3 thin films, determined from comparison of measurements carried out for investigated samples and reference samples, were estimated to 4.1 W·m―1·K―1 and 5.3 W·m―1·K―1 for the non-annealed and the annealed samples, respectively.
Author Anna Kaźmierczak-Bałata - [Politechnika Slaska w Gliwicach]
Anna Kaźmierczak-Bałata,,
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, Jerzy Bodzenta - [Silesian University of Technology (PolSL)]
Jerzy Bodzenta,,
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- Politechnika Śląska
, Maciej Krzywiecki - [Politechnika Slaska w Gliwicach]
Maciej Krzywiecki,,
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, Justyna Juszczyk - [Politechnika Slaska w Gliwicach]
Justyna Juszczyk,,
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, Jan Szmidt (FEIT / MO)
Jan Szmidt,,
- The Institute of Microelectronics and Optoelectronics
, Piotr Firek (FEIT / MO)
Piotr Firek,,
- The Institute of Microelectronics and Optoelectronics
Journal seriesThin Solid Films, ISSN 0040-6090
Issue year2013
Vol545
Pages217-221
Keywords in EnglishAtomic force microscopy, Crystallites, Annealing, Titanates, Thin films, Thermal conductivity, Ferroelectric materials,
ASJC Classification2505 Materials Chemistry; 2506 Metals and Alloys; 2508 Surfaces, Coatings and Films; 3110 Surfaces and Interfaces; 2504 Electronic, Optical and Magnetic Materials
DOIDOI:10.1016/j.tsf.2013.08.007
URL http://cat.inist.fr/?aModele=afficheN&cpsidt=27823337
Languageen angielski
File
Application of scanning microscopy to study correlation between thermal properties.pdf 932.69 KB
Score (nominal)30
Score sourcejournalList
ScoreMinisterial score = 30.0, 20-02-2020, ArticleFromJournal
Ministerial score (2013-2016) = 30.0, 20-02-2020, ArticleFromJournal
Publication indicators WoS Citations = 9; Scopus Citations = 14; GS Citations = 20.0; Scopus SNIP (Source Normalised Impact per Paper): 2013 = 1.195; WoS Impact Factor: 2013 = 1.867 (2) - 2013=2.038 (5)
Citation count*20 (2020-08-30)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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