CAD-assisted microwave characterization of ink-jet printed CPW on PET substrates

A. Sahu , V. Devabhaktuni , Arkadiusz Lewandowski , T.M. Wallis , P. H. Aaen

Abstract

Abstract: This paper describes the computer-aided-design (CAD)-assited microwave characterization of coplanar waveguide (CPW) lines formed by ink-jet printed technology on flexible polyethylene terephthalate (PET) substrates. A spacemapping technique is used to link the measured results with simulations and the mapping is used to extract the electrical properties of the ink and supporting dielectric spacer employed during measurements. Results indicate that the losses in lines are predominantly due to the loss tangent of the substrate and the conductivity of the ink. Estimates of the conductivity of the ink and the dielectric constant of the spacer used during measurement were obtained as 2.97x107 S/m, and 1.79 respectively.
Author A. Sahu
A. Sahu,,
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, V. Devabhaktuni
V. Devabhaktuni,,
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, Arkadiusz Lewandowski ISE
Arkadiusz Lewandowski,,
- The Institute of Electronic Systems
, T.M. Wallis
T.M. Wallis,,
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, P. H. Aaen
P. H. Aaen,,
-
Pages1-3
Publication size in sheets0.3
Book 2016 88th ARFTG Microwave Measurement Conference (ARFTG), 2016, IEEE, [978-1-5090-4514-3]
Keywords in EnglishCAD, Ink-jet printed CPW, flexible substrates, multi-line calibration
DOIDOI:10.1109/ARFTG.2016.7884695
URL http://ieeexplore.ieee.org/abstract/document/
Languageen angielski
Score (nominal)15
ScoreMinisterial score [Punktacja MNiSW] = 15.0, 30-11-2017, BookChapterMatConf
Ministerial score (2013-2016) [Punktacja MNiSW (2013-2016)] = 15.0, 30-11-2017, BookChapterMatConf
Citation count*1 (2018-06-15)
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