FPGA Based Charge Fast Histogramming for GEM Detector

Krzysztof Poźniak , Adrian Byszuk , M. Chernyshova , Radosław Cieszewski , Tomasz Czarski , Wojciech Dominik , K. Jakubowska , Grzegorz Henryk Kasprowicz , J. Rzadkiewicz , M. Scholz , Wojciech Zabołotny


This article presents a fast charge histogramming method for the position sensitive X-ray GEM detector. The energy resolved measurements are carried out simultaneously for 256 channels of the GEM detector. The whole process of histogramming is performed in 21 FPGA chips (Spartan-6 series from Xilinx) . The results of the histogramming process are stored in an external DDR3 memory. The structure of an electronic measuring equipment and a firmware functionality implemented in the FPGAs is described. Examples of test measurements are presented.
Author Krzysztof Poźniak (FEIT / PE)
Krzysztof Poźniak,,
- The Institute of Electronic Systems
, Adrian Byszuk (FEIT / PE)
Adrian Byszuk,,
- The Institute of Electronic Systems
, M. Chernyshova - [Instytut Problemow Jadrowyc]
M. Chernyshova,,
, Radosław Cieszewski (FEIT / PE)
Radosław Cieszewski,,
- The Institute of Electronic Systems
, Tomasz Czarski - [Instytut Problemow Jadrowyc]
Tomasz Czarski,,
, Wojciech Dominik - [University of Warsaw (UW)]
Wojciech Dominik,,
- Uniwersytet Warszawski
, K. Jakubowska - [Instytut Problemow Jadrowyc]
K. Jakubowska,,
, Grzegorz Henryk Kasprowicz (FEIT / PE)
Grzegorz Henryk Kasprowicz,,
- The Institute of Electronic Systems
, J. Rzadkiewicz - [Instytut Problemow Jadrowyc]
J. Rzadkiewicz,,
, M. Scholz - [Henryk Niewodniczanski Institute of Nuclear Physics of the Polish Academy of Sciences]
M. Scholz,,
et al.`
Book Romaniuk Ryszard (eds.): Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, vol. 8903, 2013, SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA , SPIE, ISBN 9780819497857, [ISSN 0277-786X ], 410 p., DOI:10.1117/12.2049644
Keywords in EnglishGEM detector, FPGA, charge identification, data processing, fast histogramming, VHDL, Xilinx
Languageen angielski
Score (nominal)15
Score sourceconferenceIndex
ScoreMinisterial score = 10.0, 29-08-2020, BookChapterMatConfByIndicator
Ministerial score (2013-2016) = 15.0, 29-08-2020, BookChapterMatConfByIndicator
Publication indicators Scopus Citations = 27; WoS Citations = 15; GS Citations = 37.0
Citation count*37 (2020-09-15)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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