Mechatronics in monitoring, simulation and diagnostics of industrial and biological processes

Natalia Golnik , Marek Dobosz , Małgorzata Jakubowska , Jan Kościelny , Małgorzata Kujawińska , Tadeusz Pałko , Barbara Putz , Robert Sitnik , Paweł Wnuk , Adam Woźniak

Abstract

The paper describes a number of research projects of the Faculty of Mechatronics of Warsaw University of Technology in order to illustrate the use of common mechatronics and optomechatronics approach in solving multidisciplinary technical problems. Projects on sensors development, measurement and industrial control systems, multimodal data capture and advance systems for monitoring and diagnostics of industrial processes are presented and discussed.
Author Natalia Golnik (FM / IMBE)
Natalia Golnik,,
- The Institute of Metrology and Biomedical Engineering
, Marek Dobosz (FM / IMBE)
Marek Dobosz,,
- The Institute of Metrology and Biomedical Engineering
, Małgorzata Jakubowska (FM / IMBE)
Małgorzata Jakubowska,,
- The Institute of Metrology and Biomedical Engineering
, Jan Kościelny (FM / IACR)
Jan Kościelny,,
- The Institute of Automatic Control and Robotics
, Małgorzata Kujawińska (FM / IMPh)
Małgorzata Kujawińska,,
- The Institute of Micromechanics and Photonics
, Tadeusz Pałko (FM / IMBE)
Tadeusz Pałko,,
- The Institute of Metrology and Biomedical Engineering
, Barbara Putz (FM / IACR)
Barbara Putz,,
- The Institute of Automatic Control and Robotics
, Robert Sitnik (FM / IMPh)
Robert Sitnik,,
- The Institute of Micromechanics and Photonics
, Paweł Wnuk (FM / IACR)
Paweł Wnuk,,
- The Institute of Automatic Control and Robotics
, Adam Woźniak (FM / IMBE)
Adam Woźniak,,
- The Institute of Metrology and Biomedical Engineering
Pages890313-1-890313-15
Book Romaniuk Ryszard (eds.): Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, vol. 8903, 2013, SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA , SPIE, ISBN 9780819497857, [ISSN 0277-786X ], 410 p., DOI:10.1117/12.2049644
Keywords in EnglishMechatronics, optomechatronics, sensors, M(O)EMS, optical metrology, imaging, control systems
DOIDOI:10.1117/12.2049644
URL http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1763134
Languageen angielski
Score (nominal)15
Score sourceconferenceIndex
ScoreMinisterial score = 10.0, 29-08-2020, BookChapterMatConfByIndicator
Ministerial score (2013-2016) = 15.0, 29-08-2020, BookChapterMatConfByIndicator
Publication indicators WoS Citations = 0; Scopus Citations = 0
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