Computer-Aided Detection of Plagiarism in Integrated-Circuit Layouts
Dominik Krzysztof Kasprowicz , Hilekaan Wada
AbstractWhile software detecting plagiarism in text or computer code is commonly used these days, no counterpart exists for integrated-circuit (IC) layouts. This paper proposes several criteria of IC-layout dissimilarity that can be used for computer-aided layouts matching. A program based on these criteria is shown to successfully identify similar layouts in a pool of designs.
|Book||Napieralski Andrzej (eds.): Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems MIXDES, 2013 , vol. CFP13MIX-PRT, 2013, USA, IEEE Xplore Digital Library, ISBN 978-83-63578-01-5, 625 p.|
|Keywords in English||plagiarism detection, copyright protection, integrated circuit, layout|
|Score|| = 10.0, 11-01-2020, BookChapterMatConfByIndicator|
= 15.0, 11-01-2020, BookChapterMatConfByIndicator
|Publication indicators||= 1; = 1.0|
|Citation count*||1 (2020-09-04)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.