Computer-Aided Detection of Plagiarism in Integrated-Circuit Layouts

Dominik Krzysztof Kasprowicz , Hilekaan Wada

Abstract

While software detecting plagiarism in text or computer code is commonly used these days, no counterpart exists for integrated-circuit (IC) layouts. This paper proposes several criteria of IC-layout dissimilarity that can be used for computer-aided layouts matching. A program based on these criteria is shown to successfully identify similar layouts in a pool of designs.
Author Dominik Krzysztof Kasprowicz (FEIT / MO)
Dominik Krzysztof Kasprowicz,,
- The Institute of Microelectronics and Optoelectronics
, Hilekaan Wada
Hilekaan Wada,,
-
Pages213-217
Book Napieralski Andrzej (eds.): Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems MIXDES, 2013 , vol. CFP13MIX-PRT, 2013, USA, IEEE Xplore Digital Library, ISBN 978-83-63578-01-5, 625 p.
Keywords in Englishplagiarism detection, copyright protection, integrated circuit, layout
URL http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6613343
Languageen angielski
Score (nominal)15
Score sourceconferenceIndex
ScoreMinisterial score = 10.0, 11-01-2020, BookChapterMatConfByIndicator
Ministerial score (2013-2016) = 15.0, 11-01-2020, BookChapterMatConfByIndicator
Publication indicators WoS Citations = 1; GS Citations = 1.0
Citation count*1 (2020-09-04)
Cite
Share Share

Get link to the record


* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
Back
Confirmation
Are you sure?