Microwave complex permittivity of voltage-tunable nematic liquid crystals measured in high resistivity silicon transducers

Rafał Kowerdziej , Jerzy Krupka , Edward Nowinowski-Kruszelnicki , Marek Olifierczuk , Janusz Parka


A split post dielectric resonator is used to determine the effect of AC bias voltage on the microwave complex permittivity of nematic liquid crystals. High resistivity silicon transducers separated by 100 μm are bridged by nematic liquid crystals and their properties determined. The in-plane permittivity of liquid crystals can be effectively tuned (change of effective permittivity of up to 8%) by increasing the AC bias voltage from 0 to 6 V. Using high resistivity silicon allowed us to obtain tunable dielectric stacks with relatively small dielectric losses at microwave frequencies.
Author Rafał Kowerdziej - [Wojskowa Akademia Techniczna]
Rafał Kowerdziej,,
, Jerzy Krupka (FEIT / MO)
Jerzy Krupka,,
- The Institute of Microelectronics and Optoelectronics
, Edward Nowinowski-Kruszelnicki - [Wojskowa Akademia Techniczna]
Edward Nowinowski-Kruszelnicki,,
, Marek Olifierczuk - [Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego (WAT)]
Marek Olifierczuk,,
- Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
, Janusz Parka - [INSTITUTE OF APPLIED PHYSICS, MUT [Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego (WAT)]]
Janusz Parka,,
Journal seriesApplied Physics Letters, ISSN 0003-6951
Issue year2013
Publication size in sheets0.5
ASJC Classification3101 Physics and Astronomy (miscellaneous)
URL http://scitation.aip.org/content/aip/journal/apl/102/10/10.1063/1.4795534
Languageen angielski
Score (nominal)40
Score sourcejournalList
ScoreMinisterial score = 40.0, 25-05-2020, ArticleFromJournal
Ministerial score (2013-2016) = 40.0, 25-05-2020, ArticleFromJournal
Publication indicators Scopus Citations = 10; WoS Citations = 12; GS Citations = 15.0; Scopus SNIP (Source Normalised Impact per Paper): 2013 = 1.634; WoS Impact Factor: 2013 = 3.515 (2) - 2013=3.739 (5)
Citation count*15 (2020-09-06)
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* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
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