Contrast in transmission X-ray diffraction topographs of growth defects in the core of SrLaGaO4 single crystals

Agnieszka Malinowska , M. Lefeld-Sosnowska , J. Härtwig


Defects in the core of SrLaGaO4 single crystals, grown by the Czochralski method using a [001]-oriented seed, were studied by transmission X-ray diffraction projection topography. Topographs were taken with radiation from a laboratory source and with high-energy radiation available at the ESRF beamline ID19 in Grenoble. The contrast of the investigated defect images was analysed for various diffraction vectors g and for various values of the product μ0 t (μ0 is the linear absorption coefficient and t the crystal thickness). This allowed the contrast formation to be studied as a function of absorption. The results of the analysis confirm the model of crystal lattice deformation around rod-like volume defects in SrLaGaO4 crystals. © 2013 International Union of Crystallography.
Author Agnieszka Malinowska (FP / SD)
Agnieszka Malinowska,,
- Semiconductors Division
, M. Lefeld-Sosnowska
M. Lefeld-Sosnowska,,
, J. Härtwig
J. Härtwig,,
Journal seriesJournal of Applied Crystallography, ISSN 0021-8898
Issue year2013
Keywords in EnglishBeam lines; Crystal lattice deformation; Crystal thickness; Crystallographic defects; Defect images; Diffraction contrast; Diffraction vectors; Grenoble; Growth defects; High-energy radiations; Laboratory source; Linear absorption coefficient; SrLaGaO4; SrLaGaO4; Volume defects; X-ray diffraction topography, Single crystals; X ray diffraction, Crystal defects
Score (nominal)40
ScoreMinisterial score = 35.0, 28-11-2017, ArticleFromJournal
Ministerial score (2013-2016) = 40.0, 28-11-2017, ArticleFromJournal
Publication indicators WoS Impact Factor: 2013 = 3.95 (2) - 2013=4.792 (5)
Citation count*2 (2015-03-07)
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