Contrast in transmission X-ray diffraction topographs of growth defects in the core of SrLaGaO4 single crystals
Agnieszka Malinowska , M. Lefeld-Sosnowska , J. Härtwig
AbstractDefects in the core of SrLaGaO4 single crystals, grown by the Czochralski method using a -oriented seed, were studied by transmission X-ray diffraction projection topography. Topographs were taken with radiation from a laboratory source and with high-energy radiation available at the ESRF beamline ID19 in Grenoble. The contrast of the investigated defect images was analysed for various diffraction vectors g and for various values of the product μ0 t (μ0 is the linear absorption coefficient and t the crystal thickness). This allowed the contrast formation to be studied as a function of absorption. The results of the analysis confirm the model of crystal lattice deformation around rod-like volume defects in SrLaGaO4 crystals. © 2013 International Union of Crystallography.
|Journal series||Journal of Applied Crystallography, ISSN 0021-8898|
|Keywords in English||Beam lines; Crystal lattice deformation; Crystal thickness; Crystallographic defects; Defect images; Diffraction contrast; Diffraction vectors; Grenoble; Growth defects; High-energy radiations; Laboratory source; Linear absorption coefficient; SrLaGaO4; SrLaGaO4; Volume defects; X-ray diffraction topography, Single crystals; X ray diffraction, Crystal defects|
|Score|| = 35.0, 28-11-2017, ArticleFromJournal|
= 40.0, 28-11-2017, ArticleFromJournal
|Publication indicators||: 2013 = 3.95 (2) - 2013=4.792 (5)|
|Citation count*||2 (2015-03-07)|
* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.