RPC pattern comparator ASIC for the CMS experiment

Wiesław Kuźmicz , Elżbieta Piwowarska , Zbigniew Jaworski , Mariusz Niewczas

Abstract

n/a
Author Wiesław Kuźmicz (FEIT / MO)
Wiesław Kuźmicz,,
- The Institute of Microelectronics and Optoelectronics
, Elżbieta Piwowarska (FEIT / MO)
Elżbieta Piwowarska,,
- The Institute of Microelectronics and Optoelectronics
, Zbigniew Jaworski (FEIT / MO)
Zbigniew Jaworski,,
- The Institute of Microelectronics and Optoelectronics
, Mariusz Niewczas
Mariusz Niewczas,,
-
Corporate authorInstitute of Microelectronics and Optoelectronisc (IMiO)
Pages397-402
Book Norchip Conference Committee (eds.): Proceedings of 15th NORCHIP Seminar, 1997, Copenhagen, Denmark, Technoconsult
Languageen angielski
Score (nominal)0
Citation count*
Cite
Share Share

Get link to the record


* presented citation count is obtained through Internet information analysis and it is close to the number calculated by the Publish or Perish system.
Back
Confirmation
Are you sure?