Quantitative measurement of nanofriction between PMMA thin films and various AFM probes

Hubert Grzywacz , Michał Milczarek , Piotr Jenczyk , Wojciech Jerzy Dera , Marcin Michałowski , Dariusz Jarząbek

Abstract

This study reports the quantitative, precise and accurate results of nanoscale friction measurements with the use of an Atomic Force Microscope calibrated with a precise nanoforce sensor. For this purpose, three samples of spin-coated thin Polymethylmethacrylate (PMMA) films were prepared with the following thicknesses: 235, 343, and 513 nm. Three different AFM probes were used for the friction measurements: with diamond-like carbon (DLC) tip with a small (15 nm) or big (2 µm) tip radius, and a reference silicon tip with a small (8 nm) radius. The results show that in all of the studied cases, the coefficient of friction strongly depends on the applied load, being much higher for a lower load. Furthermore, a strong relation of the friction force on the cantilever's geometry, the scanning velocity, and the film thickness was observed.
Author Hubert Grzywacz
Hubert Grzywacz,,
-
, Michał Milczarek (FM)
Michał Milczarek,,
- Faculty of Mechatronics
, Piotr Jenczyk - Institute of Fundamental Technological Research Polish Academy of Sciences (IPPT PAN) [Polish Academy of Sciences (PAN)]
Piotr Jenczyk,,
-
, Wojciech Jerzy Dera
Wojciech Jerzy Dera,,
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, Marcin Michałowski (FM / IMPh)
Marcin Michałowski,,
- The Institute of Micromechanics and Photonics
, Dariusz Jarząbek (FM / IMPh) - Institute of Fundamental Technological Research Polish Academy of Sciences (IPPT PAN) [Polish Academy of Sciences (PAN)]
Dariusz Jarząbek,,
- The Institute of Micromechanics and Photonics
Journal seriesMeasurement, [Measurement: Journal of the International Measurement Confederation], ISSN 0263-2241, e-ISSN 1873-412X
Issue year2021
Vol168
Publication size in sheets0.3
Article number108267
Keywords in EnglishFriction, Atomic force microscopy, Probes, Thin films
ASJC Classification2208 Electrical and Electronic Engineering; 2604 Applied Mathematics; 3104 Condensed Matter Physics; 3105 Instrumentation
DOIDOI:10.1016/j.measurement.2020.108267
Languageen angielski
Score (nominal)200
Score sourcejournalList
ScoreMinisterial score = 200.0, 18-08-2020, ArticleFromJournal
Publication indicators Scopus SNIP (Source Normalised Impact per Paper): 2017 = 1.566; WoS Impact Factor: 2018 = 2.791 (2) - 2018=2.826 (5)
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