Quantitative measurement of nanofriction between PMMA thin films and various AFM probes
Hubert Grzywacz , Michał Milczarek , Piotr Jenczyk , Wojciech Jerzy Dera , Marcin Michałowski , Dariusz Jarząbek
AbstractThis study reports the quantitative, precise and accurate results of nanoscale friction measurements with the use of an Atomic Force Microscope calibrated with a precise nanoforce sensor. For this purpose, three samples of spin-coated thin Polymethylmethacrylate (PMMA) films were prepared with the following thicknesses: 235, 343, and 513 nm. Three different AFM probes were used for the friction measurements: with diamond-like carbon (DLC) tip with a small (15 nm) or big (2 µm) tip radius, and a reference silicon tip with a small (8 nm) radius. The results show that in all of the studied cases, the coefficient of friction strongly depends on the applied load, being much higher for a lower load. Furthermore, a strong relation of the friction force on the cantilever's geometry, the scanning velocity, and the film thickness was observed.
|Journal series||Measurement, [Measurement: Journal of the International Measurement Confederation], ISSN 0263-2241, e-ISSN 1873-412X|
|Publication size in sheets||0.3|
|Keywords in English||Friction, Atomic force microscopy, Probes, Thin films|
|ASJC Classification||; ; ;|
|Score||= 200.0, 18-08-2020, ArticleFromJournal|
|Publication indicators||: 2017 = 1.566; : 2018 = 2.791 (2) - 2018=2.826 (5)|
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